Nanostructured thin films of indium oxide nanocrystals confined in alumina matrixes
Identifieur interne : 002943 ( Main/Repository ); précédent : 002942; suivant : 002944Nanostructured thin films of indium oxide nanocrystals confined in alumina matrixes
Auteurs : RBID : Pascal:11-0113278Descripteurs français
- Pascal (Inist)
- Nanostructure, Couche mince, Nanocristal, Nanomatériau, Alumine, Procédé dépôt, Propriété physique, Méthode étude, Diffraction RX, Spectre absorption, Microscopie électronique transmission, Morphologie, Recuit, Réseau cubique, Oxyde d'indium, Oxyde d'aluminium, Verre borosilicate, Silicium, Propriété optique, Bande interdite, Propriété électronique, Matériau composite, Microstructure cristalline, Pulvérisation irradiation, In2O3, Si, 8107, 6855J, 7866, 7320.
- Wicri :
- concept : Matériau composite.
English descriptors
- KwdEn :
- Absorption spectra, Alumina, Aluminium oxide, Annealing, Borosilicate glass, Composite materials, Crystal microstructure, Cubic lattices, Deposition process, Electronic properties, Energy gap, Indium oxide, Investigation method, Morphology, Nanocrystal, Nanostructured materials, Nanostructures, Optical properties, Physical properties, Silicon, Sputtering, Thin films, Transmission electron microscopy, XRD.
Abstract
Nanocrystals of indium oxide (In2O3) with sizes below 10 nm were prepared in alumina matrixes by using a co-pulverization method. The used substrates such as borosilicate glasses or (100) silicon as well as the substrate temperatures during the deposition process were modified and their effects characterized on the structural and physical properties of alumina-In2O3 films. Complementary investigation methods including X-ray diffraction. optical transmittance in the range 250-1100 nm and transmission electron microscopy were used to analyze the nanostructured films. The crystalline order, morphology and optical responses were monitored as function of the deposition parameters and the post-synthesis annealing. The optimal conditions were found and allow realizing suitable nanostructured films with a major crystalline order of cubic phase for the In2O3 nanocrystals. The optical properties of the films were analyzed and the key parameters such as direct and indirect band gaps were evaluated as function of the synthesis conditions and the crystalline quality of the films.
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Pascal:11-0113278Le document en format XML
<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en" level="a">Nanostructured thin films of indium oxide nanocrystals confined in alumina matrixes</title><author><name sortKey="Bouifoulen, A" uniqKey="Bouifoulen A">A. Bouifoulen</name><affiliation wicri:level="4"><inist:fA14 i1="01"><s1>Laboratoire de Physique de l'Etat Condensé, UMR-CNRS 6087, Institut de recherche IRIM2F-FR-CNRS 2575-Université du Maine, Avenue Olivier Messiaen</s1><s2>72085 Le Mans</s2><s3>FRA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Pays de la Loire</region><settlement type="city">Le Mans</settlement></placeName><orgName type="university">Université du Maine</orgName></affiliation><affiliation wicri:level="1"><inist:fA14 i1="02"><s1>Laboratoire de Physique du Solide et Couches Minces, Faculté des Sciences Semlalia, Université Cadi Ayyad, B. 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Errien</name><affiliation wicri:level="4"><inist:fA14 i1="01"><s1>Laboratoire de Physique de l'Etat Condensé, UMR-CNRS 6087, Institut de recherche IRIM2F-FR-CNRS 2575-Université du Maine, Avenue Olivier Messiaen</s1><s2>72085 Le Mans</s2><s3>FRA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Pays de la Loire</region><settlement type="city">Le Mans</settlement></placeName><orgName type="university">Université du Maine</orgName></affiliation></author><author><name sortKey="Kassiba, A" uniqKey="Kassiba A">A. Kassiba</name><affiliation wicri:level="4"><inist:fA14 i1="01"><s1>Laboratoire de Physique de l'Etat Condensé, UMR-CNRS 6087, Institut de recherche IRIM2F-FR-CNRS 2575-Université du Maine, Avenue Olivier Messiaen</s1><s2>72085 Le Mans</s2><s3>FRA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Pays de la Loire</region><settlement type="city">Le Mans</settlement></placeName><orgName type="university">Université du Maine</orgName></affiliation></author><author><name sortKey="Outzourhit, A" uniqKey="Outzourhit A">A. Outzourhit</name><affiliation wicri:level="1"><inist:fA14 i1="02"><s1>Laboratoire de Physique du Solide et Couches Minces, Faculté des Sciences Semlalia, Université Cadi Ayyad, B. P. 2390</s1><s2>Marrakech 40000</s2><s3>MAR</s3><sZ>1 aut.</sZ><sZ>5 aut.</sZ><sZ>9 aut.</sZ></inist:fA14><country>Maroc</country><wicri:noRegion>Marrakech 40000</wicri:noRegion></affiliation></author><author><name sortKey="Makowska Janusik, M" uniqKey="Makowska Janusik M">M. Makowska-Janusik</name><affiliation wicri:level="1"><inist:fA14 i1="03"><s1>Institute of Physics, Jan Dlugosz University, 13/15 Al. Armii Krajowej</s1><s2>42-200 Czestochowa</s2><s3>POL</s3><sZ>6 aut.</sZ></inist:fA14><country>Pologne</country><wicri:noRegion>42-200 Czestochowa</wicri:noRegion></affiliation></author><author><name sortKey="Gautier, N" uniqKey="Gautier N">N. Gautier</name><affiliation wicri:level="3"><inist:fA14 i1="04"><s1>Institut des Matériaux Jean Rouxel (IMN), Université de Nantes-CNRS, UMR 6502, 2 rue de la Houssinière, BP 32229</s1><s2>44322 Nantes</s2><s3>FRA</s3><sZ>7 aut.</sZ><sZ>8 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Pays de la Loire</region><settlement type="city">Nantes</settlement></placeName></affiliation></author><author><name sortKey="Lajaunie, L" uniqKey="Lajaunie L">L. Lajaunie</name><affiliation wicri:level="3"><inist:fA14 i1="04"><s1>Institut des Matériaux Jean Rouxel (IMN), Université de Nantes-CNRS, UMR 6502, 2 rue de la Houssinière, BP 32229</s1><s2>44322 Nantes</s2><s3>FRA</s3><sZ>7 aut.</sZ><sZ>8 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Pays de la Loire</region><settlement type="city">Nantes</settlement></placeName></affiliation></author><author><name sortKey="Oueriagli, A" uniqKey="Oueriagli A">A. Oueriagli</name><affiliation wicri:level="1"><inist:fA14 i1="02"><s1>Laboratoire de Physique du Solide et Couches Minces, Faculté des Sciences Semlalia, Université Cadi Ayyad, B. P. 2390</s1><s2>Marrakech 40000</s2><s3>MAR</s3><sZ>1 aut.</sZ><sZ>5 aut.</sZ><sZ>9 aut.</sZ></inist:fA14><country>Maroc</country><wicri:noRegion>Marrakech 40000</wicri:noRegion></affiliation></author></titleStmt><publicationStmt><idno type="inist">11-0113278</idno><date when="2011">2011</date><idno type="stanalyst">PASCAL 11-0113278 INIST</idno><idno type="RBID">Pascal:11-0113278</idno><idno type="wicri:Area/Main/Corpus">003577</idno><idno type="wicri:Area/Main/Repository">002943</idno></publicationStmt><seriesStmt><idno type="ISSN">0040-6090</idno><title level="j" type="abbreviated">Thin solid films</title><title level="j" type="main">Thin solid films</title></seriesStmt></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Absorption spectra</term><term>Alumina</term><term>Aluminium oxide</term><term>Annealing</term><term>Borosilicate glass</term><term>Composite materials</term><term>Crystal microstructure</term><term>Cubic lattices</term><term>Deposition process</term><term>Electronic properties</term><term>Energy gap</term><term>Indium oxide</term><term>Investigation method</term><term>Morphology</term><term>Nanocrystal</term><term>Nanostructured materials</term><term>Nanostructures</term><term>Optical properties</term><term>Physical properties</term><term>Silicon</term><term>Sputtering</term><term>Thin films</term><term>Transmission electron microscopy</term><term>XRD</term></keywords><keywords scheme="Pascal" xml:lang="fr"><term>Nanostructure</term><term>Couche mince</term><term>Nanocristal</term><term>Nanomatériau</term><term>Alumine</term><term>Procédé dépôt</term><term>Propriété physique</term><term>Méthode étude</term><term>Diffraction RX</term><term>Spectre absorption</term><term>Microscopie électronique transmission</term><term>Morphologie</term><term>Recuit</term><term>Réseau cubique</term><term>Oxyde d'indium</term><term>Oxyde d'aluminium</term><term>Verre borosilicate</term><term>Silicium</term><term>Propriété optique</term><term>Bande interdite</term><term>Propriété électronique</term><term>Matériau composite</term><term>Microstructure cristalline</term><term>Pulvérisation irradiation</term><term>In2O3</term><term>Si</term><term>8107</term><term>6855J</term><term>7866</term><term>7320</term></keywords><keywords scheme="Wicri" type="concept" xml:lang="fr"><term>Matériau composite</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">Nanocrystals of indium oxide (In<sub>2</sub>O<sub>3</sub>) with sizes below 10 nm were prepared in alumina matrixes by using a co-pulverization method. The used substrates such as borosilicate glasses or (100) silicon as well as the substrate temperatures during the deposition process were modified and their effects characterized on the structural and physical properties of alumina-In<sub>2</sub>O<sub>3</sub> films. Complementary investigation methods including X-ray diffraction. optical transmittance in the range 250-1100 nm and transmission electron microscopy were used to analyze the nanostructured films. The crystalline order, morphology and optical responses were monitored as function of the deposition parameters and the post-synthesis annealing. The optimal conditions were found and allow realizing suitable nanostructured films with a major crystalline order of cubic phase for the In<sub>2</sub>O<sub>3</sub> nanocrystals. The optical properties of the films were analyzed and the key parameters such as direct and indirect band gaps were evaluated as function of the synthesis conditions and the crystalline quality of the films.</div></front></TEI><inist><standard h6="B"><pA><fA01 i1="01" i2="1"><s0>0040-6090</s0></fA01><fA02 i1="01"><s0>THSFAP</s0></fA02><fA03 i2="1"><s0>Thin solid films</s0></fA03><fA05><s2>519</s2></fA05><fA06><s2>7</s2></fA06><fA08 i1="01" i2="1" l="ENG"><s1>Nanostructured thin films of indium oxide nanocrystals confined in alumina matrixes</s1></fA08><fA11 i1="01" i2="1"><s1>BOUIFOULEN (A.)</s1></fA11><fA11 i1="02" i2="1"><s1>EDELY (M.)</s1></fA11><fA11 i1="03" i2="1"><s1>ERRIEN (N.)</s1></fA11><fA11 i1="04" i2="1"><s1>KASSIBA (A.)</s1></fA11><fA11 i1="05" i2="1"><s1>OUTZOURHIT (A.)</s1></fA11><fA11 i1="06" i2="1"><s1>MAKOWSKA-JANUSIK (M.)</s1></fA11><fA11 i1="07" i2="1"><s1>GAUTIER (N.)</s1></fA11><fA11 i1="08" i2="1"><s1>LAJAUNIE (L.)</s1></fA11><fA11 i1="09" i2="1"><s1>OUERIAGLI (A.)</s1></fA11><fA14 i1="01"><s1>Laboratoire de Physique de l'Etat Condensé, UMR-CNRS 6087, Institut de recherche IRIM2F-FR-CNRS 2575-Université du Maine, Avenue Olivier Messiaen</s1><s2>72085 Le Mans</s2><s3>FRA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ></fA14><fA14 i1="02"><s1>Laboratoire de Physique du Solide et Couches Minces, Faculté des Sciences Semlalia, Université Cadi Ayyad, B. P. 2390</s1><s2>Marrakech 40000</s2><s3>MAR</s3><sZ>1 aut.</sZ><sZ>5 aut.</sZ><sZ>9 aut.</sZ></fA14><fA14 i1="03"><s1>Institute of Physics, Jan Dlugosz University, 13/15 Al. Armii Krajowej</s1><s2>42-200 Czestochowa</s2><s3>POL</s3><sZ>6 aut.</sZ></fA14><fA14 i1="04"><s1>Institut des Matériaux Jean Rouxel (IMN), Université de Nantes-CNRS, UMR 6502, 2 rue de la Houssinière, BP 32229</s1><s2>44322 Nantes</s2><s3>FRA</s3><sZ>7 aut.</sZ><sZ>8 aut.</sZ></fA14><fA20><s1>2141-2145</s1></fA20><fA21><s1>2011</s1></fA21><fA23 i1="01"><s0>ENG</s0></fA23><fA43 i1="01"><s1>INIST</s1><s2>13597</s2><s5>354000194377800170</s5></fA43><fA44><s0>0000</s0><s1>© 2011 INIST-CNRS. All rights reserved.</s1></fA44><fA45><s0>41 ref.</s0></fA45><fA47 i1="01" i2="1"><s0>11-0113278</s0></fA47><fA60><s1>P</s1></fA60><fA61><s0>A</s0></fA61><fA64 i1="01" i2="1"><s0>Thin solid films</s0></fA64><fA66 i1="01"><s0>NLD</s0></fA66><fC01 i1="01" l="ENG"><s0>Nanocrystals of indium oxide (In<sub>2</sub>O<sub>3</sub>) with sizes below 10 nm were prepared in alumina matrixes by using a co-pulverization method. The used substrates such as borosilicate glasses or (100) silicon as well as the substrate temperatures during the deposition process were modified and their effects characterized on the structural and physical properties of alumina-In<sub>2</sub>O<sub>3</sub> films. Complementary investigation methods including X-ray diffraction. optical transmittance in the range 250-1100 nm and transmission electron microscopy were used to analyze the nanostructured films. The crystalline order, morphology and optical responses were monitored as function of the deposition parameters and the post-synthesis annealing. The optimal conditions were found and allow realizing suitable nanostructured films with a major crystalline order of cubic phase for the In<sub>2</sub>O<sub>3</sub> nanocrystals. 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